The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2026

Filed:

Aug. 31, 2021
Applicants:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Toshiba Energy Systems & Solutions Corporation, Kawasaki, JP;

Inventors:

Susumu Naito, Yokohama Kanagawa, JP;

Kouta Nakata, Tokyo, JP;

Yasunori Taguchi, Kawasaki Kanagawa, JP;

Yuichi Kato, Kawasaki Kanagawa, JP;

Chikashi Miyamoto, Tokyo, JP;

Toshio Aoki, Tokyo, JP;

Shinya Tominaga, Kawasaki Kanagawa, JP;

Isaku Nagura, Kawasaki Kanagawa, JP;

Ryota Miyake, Kawasaki Kanagawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G05B 23/024 (2013.01); G05B 23/0221 (2013.01); G05B 23/0243 (2013.01); G05B 23/0251 (2013.01); G05B 23/0254 (2013.01); G06N 20/00 (2019.01);
Abstract

According to one embodiment, a processing circuit classifies a time-series data corresponding to process amounts generated in a target facility into groups. For each of groups, the processing circuit applies time-series data included in the group to a first auto-encoder, which differs depending upon each group, and outputs time-series data. The processing circuit applies input difference data, which are based on output time-series data on the process amounts and the input time-series data, to a single second auto-encoder, and outputs difference data. The processing circuit determines an abnormality of the target facility, based on the comparison between addition data which are based on the output difference data and the output time-series data, and the input time-series data.


Find Patent Forward Citations

Naito, Susumu. (2026). Abnormality determination apparatus, learning apparatus and abnormality determination method for power plant or factory (U.S. Patent No. 12535806). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12535806

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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