The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2026

Filed:

Jun. 04, 2020
Applicant:

Schlumberger Technology Corporation, Sugar Land, TX (US);

Inventors:

Daniel B. Palmowski, Aachen, DE;

Thomas Fuchs, Aachen, DE;

Adrian Kleine, Aachen, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/48 (2006.01); G01V 11/00 (2006.01); G01V 20/00 (2024.01);
U.S. Cl.
CPC ...
G01V 20/00 (2024.01); G01V 11/002 (2013.01); G01V 2210/66 (2013.01);
Abstract

A method includes determining a present-day thickness of a lithosphere. The method also includes determining whether the determined present-day thickness of the lithosphere substantially matches an interpreted present-day thickness of the lithosphere. The method also includes generating or updating a temperature history model in response to determining that the determined present-day thickness of the lithosphere substantially matches the interpreted present-day thickness of the lithosphere.


Find Patent Forward Citations

Palmowski, Daniel. (2026). System and method for reducing uncertainties in thermal histories (U.S. Patent No. 12535617). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12535617

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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