The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2026

Filed:

Apr. 23, 2021
Applicant:

Duke University, Durham, NC (US);

Inventors:

Joseph Izatt, Durham, NC (US);

Ruobing Qian, Durham, NC (US);

Kevin Zhou, Durham, NC (US);

Assignee:

DUKE UNIVERSITY, Durham, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 17/42 (2006.01); G01S 17/89 (2020.01); G02B 5/18 (2006.01); G02B 27/30 (2006.01); G06T 5/20 (2006.01); G06T 5/70 (2024.01); G06T 7/521 (2017.01);
U.S. Cl.
CPC ...
G01S 17/42 (2013.01); G01S 17/89 (2013.01); G02B 5/1866 (2013.01); G02B 27/30 (2013.01); G06T 5/20 (2013.01); G06T 5/70 (2024.01); G06T 7/521 (2017.01); G06T 2207/10028 (2013.01); G06T 2207/20032 (2013.01);
Abstract

A 3D sensing depth camera involves a time-frequency multiplexed frequency-modulated continuous wave (FMCW) LiDAR technique. A sample arm of such a system for 3D depth sensing includes a scanner for beam scanning in a first axis and a diffractive optical element for spectrally encoded scanning along a second axis. The sample arm can further include beam shaping optics such as a collimator and a lens. Processing of an interferogram comprising depth information at a different position along the second axis for each frequency sweep of the light source involves applying a windowed spectral estimator at a particular spectral window size with zero-padding and according to a specified lateral sampling approach.


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