The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2026

Filed:

Jun. 08, 2023
Applicant:

Nvidia Corporation, Santa Clara, CA (US);

Inventors:

James Critchley, Lake Orion, MI (US);

Kyle Kolasinski, Howell, MI (US);

Brian Dobkowski, Merrick, NY (US);

Assignee:

NVIDIA CORPORATION, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/72 (2006.01); G01S 7/41 (2006.01); G01S 13/58 (2006.01); G01S 13/931 (2020.01);
U.S. Cl.
CPC ...
G01S 13/723 (2013.01); G01S 7/412 (2013.01); G01S 13/589 (2013.01); G01S 13/931 (2013.01);
Abstract

One or more embodiments of the present disclosure relate to identifying reference portions corresponding to a bounding shape that corresponds to an object. Additionally, the reference portions may include a first reference edge, a second reference edge, and a reference where the first reference edge and the second reference edge intersect. In some embodiments, operations may further include obtaining a first state estimate corresponding to the object and receiving first sensor data corresponding to a first portion of the object, the first sensor data including a first position measurement. Further, operations may further include determining that the first position measurement corresponds to a first reference portion that is one of the reference portions corresponding to the bounding shape and determining a first expected position corresponding to the first portion based at least on the first reference portion. Embodiments may additionally include determining a second position estimate corresponding to the object.


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