The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2026

Filed:

Oct. 29, 2020
Applicant:

National Institute of Advanced Industrial Science and Technology, Tokyo, JP;

Inventor:

Hidemi Tsuchida, Tsukuba, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 3/08 (2006.01); G01S 7/48 (2006.01); G01S 7/4912 (2020.01); G01S 7/493 (2006.01); G01S 17/32 (2020.01); G01S 17/58 (2006.01);
U.S. Cl.
CPC ...
G01S 7/493 (2013.01); G01S 7/4808 (2013.01); G01S 7/4917 (2013.01); G01S 17/32 (2013.01); G01S 17/58 (2013.01);
Abstract

An optical measurement device includes at least a multi-frequency laser configured to simultaneously generate a frequency-fixed carrier and at least one frequency-modulated subcarrier, an optical branching element, a dual frequency beat signal generator, a difference signal generator, and an arithmetic processing unit. Either the carrier or the subcarrier within the output light of the multi-frequency laser is used as first measurement light and either the carrier or the subcarrier having a frequency different from that of the first measurement light is used as second measurement light. The dual frequency beat signal generator separates and outputs a first complex beat signal derived from the first measurement light and a second complex beat signal derived from the second measurement light. The difference signal generator outputs a difference signal between the first complex beat signal and the second complex beat signal.


Find Patent Forward Citations

Tsuchida, Hidemi. (2026). Optical measurement device and measurement method (U.S. Patent No. 12535566). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12535566

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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