The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2026

Filed:

Apr. 27, 2023
Applicant:

Zadar Labs, Inc, Santa Clara, CA (US);

Inventors:

Mohammad Emadi, San Jose, CA (US);

Mahmoud Saadat, San Jose, CA (US);

Ali Mostajeran, Morgan Hill, CA (US);

Assignee:

Zadar Labs, Inc., Campbell, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 4/02 (2018.01); G01S 5/02 (2010.01); G01S 7/41 (2006.01); G01S 7/48 (2006.01); H04W 64/00 (2009.01);
U.S. Cl.
CPC ...
G01S 7/414 (2013.01); G01S 7/415 (2013.01); G01S 7/4802 (2013.01);
Abstract

Disclosed herein are systems and methods for adaptive clustering of points from radar scans, utilizing feedback information to define appropriate clustering gate sizes, and optimizing overall radar system performance in various scenarios and environments. Various approaches enable separation of over-clustered targets into multiple clusters by removing points whose distance from a weighted center exceeds a disparity threshold, and uniting under-clustered targets into a single cluster. Outlier points can be removed based on their SNR and Doppler relative to a median SNR and median Doppler of all points in the cluster. The optimal cluster center is identified based on variable weighting techniques that consider at least one dimension beyond spatial dimensions, such as Doppler information, signal-to-noise ratio information, environmental conditions, or system constraints. Adaptive gate sizing is performed to fine-tune clustering parameters based on feedback from various sources, such as target characteristics, environmental conditions, or system constraints, using previous scan data.


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