The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2026

Filed:

Oct. 13, 2023
Applicant:

Keysight Technologies, Inc., Santa Rosa, CA (US);

Inventors:

Sumio Shimonishi, Inagi, JP;

Ryo Suzuki, Hachioji, JP;

Assignee:

KEYSIGHT TECHNOLOGIES, INC., Santa Rosa, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/302 (2006.01); G01C 3/02 (2006.01); G01K 3/00 (2006.01); G01K 7/02 (2021.01); G01R 15/20 (2006.01); G01R 27/08 (2006.01);
U.S. Cl.
CPC ...
G01R 31/302 (2013.01); G01C 3/02 (2013.01); G01K 3/005 (2013.01); G01K 7/02 (2013.01); G01R 15/202 (2013.01); G01R 27/08 (2013.01);
Abstract

A system and method for measuring a resistance (R)-magnetic field (H) curve of a magnetoresistive random-access memory (MRAM) device is described. The system includes a calibration fixture adapted to provide initial measured magnetic field data for setting a measured distance and a coil current of a coil of an electromagnet for a plurality of magnetic field strengths at a plurality of predetermined distances from an end surface of the electromagnet; a power supply adapted to provide a coil current to the electromagnet; and a laser displacement meter adapted to measure a distance from the end surface of the electromagnet to a device under test (DUT). The electromagnet is adapted to generate magnetic fields at a predetermined magnetic field sweep interval within a magnetic field sweep range from a value of a first magnetic field strength to a value of a second magnetic field strength.


Find Patent Forward Citations

Shimonishi, Sumio. (2026). System and apparatus for testing magnetoresistive random access memory (mram) devices (U.S. Patent No. 12535524). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12535524

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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