The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2026

Filed:

Jul. 10, 2024
Applicant:

Shenzhen Mindray Bio-medical Electronics Co., Ltd., Shenzhen, CN;

Inventors:

Gengwen Chen, Shenzhen, CN;

Ziqian Zhang, Shenzhen, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/58 (2006.01); G01N 1/30 (2006.01); G01N 15/01 (2024.01); G01N 15/06 (2024.01); G01N 15/075 (2024.01);
U.S. Cl.
CPC ...
G01N 33/582 (2013.01); G01N 1/30 (2013.01); G01N 15/06 (2013.01); G01N 2001/302 (2013.01); G01N 2015/014 (2024.01); G01N 2015/016 (2024.01); G01N 2015/0681 (2013.01); G01N 15/075 (2024.01);
Abstract

The disclosure provides a sample testing method and a sample analyzer, the method including: obtaining a sample to be tested; providing a reagent, the reagent including a hemolytic agent, a first fluorescent dye and a third fluorescent dye; mixing the sample and the reagent to form a sample solution; making the sample solution flow in a flow cell in a single test, irradiating the particles by using a first light source and a second light source, and detecting scattered light signals, first fluorescence signals and third fluorescence signals; obtaining a classification result and/or a counting result of white blood cells in the sample to be tested based on the first fluorescence signals and the scattered light signals; and obtaining a counting result of nucleated red blood cells in the sample to be tested based on the third fluorescence signals and the scattered light signals.


Find Patent Forward Citations

Chen, Gengwen. (2026). Sample testing method and sample analyzer (U.S. Patent No. 12535486). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12535486

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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