The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2026

Filed:

Nov. 14, 2023
Applicant:

GM Global Technology Operations Llc, Detroit, MI (US);

Inventors:

Ratandeep Singh Kukreja, Auburn Hills, MI (US);

Michael P. Balogh, Novi, MI (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/24 (2006.01); G01N 27/22 (2006.01); G01N 33/2045 (2019.01);
U.S. Cl.
CPC ...
G01N 27/24 (2013.01); G01N 27/226 (2013.01); G01N 33/2045 (2019.01);
Abstract

A system for inline inspection of an elongate strip of metal foil includes at least one pair of opposed conductive rollers each having a surface of dielectric material thereon, and a circuit electrically connecting the rollers, and a sensor for detecting changes in the capacitance between the rollers. A method of inspecting metal foil includes passing the metal foil between at least one pair of opposed conductive rollers, each roller of the pair having a surface of dielectric material thereon in contact with an opposite side of the foil, and measuring changes in an electrical property in an electrically powered circuit connecting the rollers to identify defects in the portion of the foil between the rollers.


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