The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2026
Filed:
Jul. 20, 2021
Hitachi High-tech Corporation, Tokyo, JP;
Hitachi High-Tech Corporation, Tokyo, JP;
Abstract
Provided are a far-infrared spectroscopy device and sample adapter that make it possible to highly accurately measure a sample that is not flat. A far-infrared spectroscopy device according to this invention comprises an illumination optical system for concentrating far-infrared light onto a sample and a detector for detecting light that has passed through the sample. Sample adapters are placed on the optical path of the far-infrared light between the illumination optical system and the sample and on the optical path between the sample and a detection optical element. The front surfaces of the sample adapters are roughly flat, and the shapes of the sample-side surfaces of the sample adapters roughly match the shape of the sample. The surface of the sample that the far-infrared light is concentrated on and the surface that the far-infrared light passes through are curved.