The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2026
Filed:
Apr. 22, 2024
Endress+hauser Optical Analysis, Inc., Ann Arbor, MI (US);
Nicholas Skriba, Jackson, MI (US);
Marc Winter, Gelnhausen, DE;
Endress+Hauser Optical Analysis, Inc., Ann Arbor, MI (US);
Abstract
A measuring system includes: an optical sensor for measuring a variable of a medium in a process vessel; a retractable fitting for mounting the optical sensor, including a hollow cylindrical housing with a housing wall, which includes a service chamber within the housing, and an immersion tube, which is axially movable within the housing between a service position, in which the immersion tube is withdrawn from the medium, and a process position, in which the immersion tube is in the medium, wherein the optical sensor is disposed in the immersion tube, and wherein the housing wall includes an opening adjacent the service chamber; and a calibration unit movably mounted in the opening between a rest position and a calibration position, wherein the calibration unit is outside the service chamber in the rest position, and wherein the calibration unit is in optical contact with the optical sensor in the calibration position.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile