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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12535401 B1

PDFFull Text
Date of Patent:
Jan. 27, 2026

Filed:

Mar. 23, 2022

Particle analysis system, particle analysis method, and flow cytometer system

Applicant:

Sony Group Corporation, Tokyo, JP;

Inventors:

Akio Furukawa, Tokyo, JP;

Yusaku Nakashima, Tokyo, JP;

Assignee:

SONY GROUP CORPORATION, Tokyo, JP;

Attorney:

CHIP LAW GROUP

Primary Examiner:

Mark R Gaworecki

Int. Cl.
CPC ...
G01N 15/14 (2024.01); G01N 15/01 (2024.01); G01N 15/1433 (2024.01); G01N 15/1434 (2024.01); G01N 15/149 (2024.01); G02B 21/36 (2006.01); G01N 15/10 (2006.01);
U.S. Cl.
CPC ...
G01N 15/149 (2024.01); G01N 15/01 (2024.01); G01N 15/1433 (2024.01); G01N 15/1434 (2013.01); G02B 21/367 (2013.01); G01N 2015/1006 (2013.01); G01N 2015/1452 (2013.01);
Abstract

An operation time is shortened. A particle analysis system according to an embodiment includes an imaging unit () configured to detect, as an event, a luminance change of light from a particle in a container, a first scanning unit () configured to scan a focal position of the imaging unit in a depth direction of the container, and a processing unit () configured to measure a state in the container based on the events detected at a plurality of the focal positions of the imaging unit by scanning of the first scanning unit.

Find Patent Forward Citations

Furukawa, Akio. (2026). Particle analysis system, particle analysis method, and flow cytometer system (U.S. Patent No. 12535401). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12535401

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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