The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2026

Filed:

Sep. 10, 2021
Applicant:

Commissariat a L'energie Atomique ET Aux Energies Alternatives, Paris, FR;

Inventors:

Bastien Chapuis, Tresserve, FR;

Julien Albertini, Paris, FR;

Clément Fisher, Orsay, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 5/00 (2006.01); B61L 23/04 (2006.01); B61L 27/53 (2022.01);
U.S. Cl.
CPC ...
G01M 5/0066 (2013.01); B61L 23/044 (2013.01); B61L 23/045 (2013.01); B61L 27/53 (2022.01); G01M 5/0025 (2013.01);
Abstract

Method and a device for detecting defects in an elongated structure able to act as an elastic-wave waveguide, the elongated structure being fitted with a plurality of transducers able to acquire measurement signals of characteristic quantities of elastic waves propagating in the elongated structure, each transducer being coupled to an electronic device, the set of electronic devices constituting a network of nodes configured to process measurement signals received from at least one transducer. The method is computer-implemented and comprises steps of: performing a plurality of local defect diagnoses, based on measurement signals received by a plurality of electronic devices, the measurement signals being acquired for multiple elastic wave emission phases; transmitting, to a remote server in accordance with a low-energy-consumption communication protocol, messages containing information relating to each local diagnosis, the messages being formatted in accordance with the low-energy-consumption communication protocol; aggregating the information contained in the received messages; and performing a global defect diagnosis for determining the presence or absence of a defect in the elongated structure.


Find Patent Forward Citations

Chapuis, Bastien. (2026). System and method for detecting faults in extended waveguides using a network of nodes (U.S. Patent No. 12535380). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12535380

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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