The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2026

Filed:

Feb. 18, 2022
Applicant:

Rebellion Photonics, Inc., Houston, TX (US);

Inventors:

Chuan Zhao, Sugarland, TX (US);

Quan Shen, Houston, TX (US);

Patrick Charles O'driscoll, Houston, TX (US);

Assignee:

Rebellion Photonics, Inc., Houston, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 5/00 (2022.01); G01J 3/28 (2006.01); G01J 3/42 (2006.01); G01J 5/02 (2022.01); G01M 3/00 (2006.01); G01M 3/38 (2006.01); G01N 21/3504 (2014.01); G06N 20/00 (2019.01); G06T 7/70 (2017.01);
U.S. Cl.
CPC ...
G01J 5/00 (2013.01); G01J 3/28 (2013.01); G01J 3/42 (2013.01); G01J 5/0014 (2013.01); G01J 5/026 (2013.01); G01M 3/002 (2013.01); G01M 3/38 (2013.01); G06N 20/00 (2019.01); G06T 7/70 (2017.01); G01J 2005/0077 (2013.01); G01N 2021/3513 (2013.01); G06T 2207/20081 (2013.01);
Abstract

Systems, methods, and computer program products for multi-model emission determinations are provided. An example imaging system includes an infrared (IR) imaging device configured to generate second IR image data of a first field of view of the IR imaging device at a second time and a computing device operably connected with the IR imaging device. The computing device receives the second IR image data of the first field of view from the IR imaging device and accesses a first detection model associated with the first field of view of the IR imaging device. The first detection model is generated based upon first IR image data of the first field of view of the IR imaging device generated at a first time. The computing device further generates first spectral absorption data based upon the second IR image data and the first detection model for detecting a fugitive emission.


Find Patent Forward Citations

Zhao, Chuan. (2026). Systems, methods, and computer program products for multi-model emission determinations (U.S. Patent No. 12535358). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12535358

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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