The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2026

Filed:

May. 31, 2024
Applicant:

Rtx Corporation, Farmington, CT (US);

Inventors:

Dustin Frohnapfel, Hebron, CT (US);

Daniel W. Shannon, Glastonbury, CT (US);

Robert H. Dold, Monson, MA (US);

Christopher T. Chipman, Brooklyn, CT (US);

Guthrie G. Bagdonis, Marlborough, CT (US);

John D. Cannata, Marlborough, CT (US);

Assignee:

RTX Corporation, Farmington, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/14 (2006.01); F01D 21/00 (2006.01);
U.S. Cl.
CPC ...
G01B 11/14 (2013.01); F01D 21/003 (2013.01); F05D 2260/83 (2013.01); F05D 2270/804 (2013.01);
Abstract

An apparatus measures clearances between a rotating structure within a fixed surrounding structure. A position detector determines when at least one portion of the rotating structure rotates past a hole defined in the fixed surrounding structure and generates an actuation signal responsive to rotation of the at least one portion of the rotating structure past the hole defined in the fixed surrounding structure. White light interferometer circuitry reflects a white light beam off of at least one portion of the rotating structure responsive to the actuation signal to determine a clearance between the at least one portion of the rotating structure and an inner surface of the fixed structure. The actuation signal actuates the white light interferometer circuitry to reflect the white light beam off of the at least one portion of the rotating structure through the hole defined in the fixed surrounding structure.


Find Patent Forward Citations

Frohnapfel, Dustin. (2026). White light interferometer for measuring radial growth in components experiencing rotating stresses (U.S. Patent No. 12535312). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12535312

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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