The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2026

Filed:

May. 26, 2022
Applicant:

Arima Genomics, Inc., San Diego, CA (US);

Inventors:

Anthony Schmitt, Apex, NC (US);

Catherine Tan, San Francisco, CA (US);

Derek Reid, San Diego, CA (US);

Chris De La Torre, Aliso Viejo, CA (US);

Siddarth Selvaraj, San Marcos, CA (US);

Assignee:

Arima Genomics, Inc., Carlsbad, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2018.01); C07H 1/00 (2006.01); C07H 21/04 (2006.01); C12N 15/10 (2006.01); C12Q 1/6806 (2018.01);
U.S. Cl.
CPC ...
C07H 1/00 (2013.01); C07H 21/04 (2013.01); C12N 15/1003 (2013.01); C12Q 1/6806 (2013.01);
Abstract

Provided herein are methods for detecting the presence or absence of a chromosome rearrangement in a formalin-fixed paraffin embedded (FFPE) sample with no detectable genomic variant associated with cancer. In certain embodiments, the methods include selecting a sample and performing a nucleic acid analysis on the selected sample and detecting whether a chromosome rearrangement is present or absent in the selected sample according to the nucleic acid analysis. In preferred embodiments, the nucleic acid analysis is a method that preserves spatial-proximal contiguity information.


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