The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2026
Filed:
Aug. 25, 2022
Koninklijke Philips N.v., Eindhoven, NL;
Stewart Matthew Young, Hamburg, DE;
Daniel Bystrov, Hamburg, DE;
Sven Kroenke-Hille, Hamburg, DE;
Heiner Matthias Brueck, Pinneberg, DE;
Jens Von Berg, Hamburg, DE;
Tim Philipp Harder, Ahrensburg, DE;
André Goossen, Sr., Eldena, DE;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
An X-ray imaging system () includes an X-ray source () and an X-ray detector () that are separated by an examination region () for performing an X-ray imaging operation on an object (). A processor () is configured to identify (S) one or more internal structures () within the object (), based on a comparison of depth sensor data representing a three-dimensional surface () of the object (), with an anatomical model comprising the one or more internal structures (). The processor () is also configured to compute (S), using the depth sensor data and the identified one or more internal structures (), a surface projection () of the one or more internal structures, on the surface () of the object (), from a perspective of the X-ray source (); and to output (S) an image representation of the surface projection () for displaying as an overlay on the surface () of the object ().