The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2026
Filed:
Sep. 01, 2021
Boe Technology Group Co., Ltd., Beijing, CN;
Tao Wang, Beijing, CN;
Tao Sun, Beijing, CN;
Chengjie Qin, Beijing, CN;
Ziyu Zhang, Beijing, CN;
Rui Hong, Beijing, CN;
Youwei Wang, Beijing, CN;
BOE Technology Group Co., Ltd., Beijing, CN;
Abstract
A display substrate, a display device, and a detection method for crack in encapsulation structure are provided. The display substrate includes: a base substrate including a display region and a peripheral region located on at least one side of the display region; a crack stopper located in the peripheral region and configured to prevent a crack from propagating toward the display region; an encapsulation structure disposed on the base substrate and covering the display region; and a crack detection structure disposed on the base substrate, wherein the crack detection structure is located on a side of the crack stopper facing the display region, an orthographic projection of the crack detection structure on the base substrate falls within an orthographic projection of the encapsulation structure on the base substrate, and the crack detection structure is configured to detect whether a crack exists in the encapsulation structure.