The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 20, 2026

Filed:

May. 31, 2023
Applicant:

Teledyne Scientific & Imaging, Llc, Thousand Oaks, CA (US);

Inventors:

Milap Dalal, Lansdale, PA (US);

Henry Yuan, North Wales, PA (US);

Chad Shultz, Reading, PA (US);

Andrey Rumyantsev, Feasterville, PA (US);

Assignee:

TELEDYNE SCIENTIFIC & IMAGING, LLC, Thousand Oaks, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10F 71/00 (2025.01); H10F 77/123 (2025.01);
U.S. Cl.
CPC ...
H10F 71/128 (2025.01); H10F 71/1253 (2025.01); H10F 77/1237 (2025.01);
Abstract

A method of baking a detector, the method comprising: placing a mid-wave infrared detector in an environmental chamber, wherein the environmental chamber is opaque. The mid-wave infrared detector comprises an anode, a guard terminal, and a cathode. The method further comprising connecting the anode to the cathode in a short circuit configuration, heating the environmental chamber to a bake temperature selected in the range of 60 to 70 degrees Celsius, and maintaining the detector in the environmental chamber for a period selected in the range of 72 hours to 240 hours.


Find Patent Forward Citations

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Dalal, Milap. (2026). Method of recovering hgcdte detector performance after high temperature bias-induced defect generation (U.S. Patent No. 12532565). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12532565

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