The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 20, 2026

Filed:

Aug. 13, 2020
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Hamed Pezeshki, San Diego, CA (US);

Tao Luo, San Diego, CA (US);

Arumugam Chendamarai Kannan, San Diego, CA (US);

Yan Zhou, San Diego, CA (US);

Assignee:

Qualcomm Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04W 72/541 (2023.01); H04L 5/00 (2006.01); H04W 72/542 (2023.01);
U.S. Cl.
CPC ...
H04W 72/541 (2023.01); H04L 5/0037 (2013.01); H04L 5/0051 (2013.01); H04W 72/542 (2023.01);
Abstract

Aspects presented herein provide for improved measurement and management of interference for different subbands and different Tx beams for communication with the UEs. A UE may be configured to receive scheduling for communication with a base station in a first beam direction using a first subband. The UE may be configured to measure interference of a second subband for a second beam direction. The UE may be further configured to report the measured interference to the base station. A base station may be configured to schedule communication with the UE in the first beam direction using the first subband. The base station may be further configured to receive the report of interference measured by the UE on the second subband in the second beam direction.


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