The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2026
Filed:
Jun. 19, 2023
Applicant:
Thetaray Ltd., Hod HaSharon, IL;
Inventors:
Amir Averbuch, Hod HaSharon, IL;
David Segev, Hod HaSharon, IL;
Assignee:
ThetaRay Ltd., Hod HaSharon, IL;
Primary Examiner:
Int. Cl.
CPC ...
H04L 9/40 (2022.01);
U.S. Cl.
CPC ...
H04L 63/1425 (2013.01);
Abstract
Methods that rate (i.e., ranks) the parameters (features) that cause a specific abnormal behavior to occur. It is assumed that the anomalies have already been detected by other anomaly detection methods. A method uses an algorithm based on the underlying potential of the diffusion process that is used in Diffusion Maps to reduce the dimensionality of the data. The gradient of this potential indicates the direction from an anomaly to a cluster that represents a normal behavior. This direction is used to rate the parameters that cause an abnormal behavior to occur.