The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 20, 2026

Filed:

Jun. 28, 2022
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Vamshi Krishna Kancharla, Hyderabad, IN;

Edet Edet Nkposong, Mercer Island, WA (US);

Murat Acikgoz, Kirkland, WA (US);

Hrishit Harshadbhai Patel, Bellevue, WA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 4/00 (2018.01); H04L 41/0631 (2022.01); H04L 43/0888 (2022.01);
U.S. Cl.
CPC ...
H04L 41/0631 (2013.01); H04L 43/0888 (2013.01);
Abstract

Described are examples for detecting possible failure in network nodes by monitoring, by a monitoring application, a data throughput for at least one of data sent or received at a network node over a time period, detecting a possible failure of the network node based on comparing the data throughput to an average data throughput for the network node measured over one or more historical time periods of a similar duration as the time period, and/or reporting the possible failure of the network node.


Find Patent Forward Citations

Kancharla, Vamshi. (2026). Techniques for monitoring node status using a throughput metric (U.S. Patent No. 12531772). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12531772

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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