The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 20, 2026

Filed:

Jul. 10, 2014
Applicant:

Bio-rad Laboratories, Inc., Hercules, CA (US);

Inventors:

Lakshmi Samyukta Kuchipudi, Addison, TX (US);

Curtis Parvin, Mckinney, TX (US);

John Yundt-Pacheco, Fairview, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G16H 50/20 (2018.01); G16H 10/40 (2018.01); G16H 40/40 (2018.01);
U.S. Cl.
CPC ...
G16H 50/20 (2018.01); G16H 10/40 (2018.01); G16H 40/40 (2018.01);
Abstract

Disclosed are a system and method to automatically spot-check for small out-of-control conditions of a clinical diagnostic process. The expected number of unreliable results evaluated since the last good quality control event is estimated by estimating the magnitude of the out-of-control condition, constructing concentration based bias, imprecision, and TEprofiles, and using those parameters to estimate the probability of a specimen result being unreliable. Patient specimens are automatically selected for reevaluation based on their probability of crossing a medical decision limit or having a probability of being unreliable. The system and method determine which reevaluated patient specimens need to be corrected when the results for those specimens have already been reported. Various exemplary embodiments and implementations of the system and method are included.


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