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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12530874 B1

PDFFull Text
Date of Patent:
Jan. 20, 2026

Filed:

Mar. 03, 2023

Method and device for analyzing pathological slide image

Applicant:

Lunit Inc., Seoul, KR;

Inventors:

Dong Geun Yoo, Seoul, KR;

Sang Hoon Song, Anseong-si, KR;

Chan Young Ock, Seoul, KR;

Won Kyung Jung, Seoul, KR;

Soo Ick Cho, Seoul, KR;

Kyung Hyun Paeng, Seoul, KR;

Assignee:

Lunit Inc., Seoul, KR;

Attorney:

Sughrue Mion, PLLC

Primary Examiner:

Tsung Yin Tsai

Int. Cl.
CPC ...
G06V 10/774 (2022.01); G06T 7/00 (2017.01); G06V 20/69 (2022.01);
U.S. Cl.
CPC ...
G06V 10/774 (2022.01); G06T 7/0012 (2013.01); G06V 20/698 (2022.01); G06T 2207/20081 (2013.01); G06T 2207/30024 (2013.01); G06V 2201/03 (2022.01);
Abstract

Provided is a computing device including at least one memory, and at least one processor configured to obtain a first pathological slide image one of a first object and biological information of the first object, generate training data by using at least one first patch included in the first pathological slide image, and the biological information, train a first machine learning model based on the training data, and analyze a second pathological slide image of a second object by using the trained first machine learning model.

Find Patent Forward Citations

Yoo, Dong. (2026). Method and device for analyzing pathological slide image (U.S. Patent No. 12530874). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12530874

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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