The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 20, 2026

Filed:

Nov. 01, 2022
Applicant:

Samsung Display Co., Ltd., Yongin-si, KR;

Inventor:

Gihyun Lee, Yongin-si, KR;

Assignee:

SAMSUNG DISPLAY CO., LTD., Gyeonggi-Do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/764 (2022.01); G06T 7/00 (2017.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06V 10/764 (2022.01); G06T 7/0004 (2013.01); G06V 10/82 (2022.01);
Abstract

An inspection system for a manufacturing apparatus of a display device including a chamber includes: an electronic device configured to obtain image data by photographing an inside of the chamber; and an inspection device configured to inspect the inside of the chamber from the obtained image data transmitted by the electronic device by using a machine-learning model based on an artificial neural network and transmit, to the electronic device, an inspection result indicating whether the inside of the chamber is in a preset state.


Find Patent Forward Citations

Lee, Gihyun. (2026). Inspection system for apparatus for manufacturing display device and inspection method for apparatus for manufacturing display device (U.S. Patent No. 12530866). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12530866

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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