The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2026
Filed:
Jun. 26, 2023
Rivalshot Corp., Atherton, CA (US);
Paul Clauson, Atherton, CA (US);
Matthew Newell, Reno, NV (US);
Max Lee, Bountiful, UT (US);
Teja Veeramacheneni, Fremont, CA (US);
RivalShot Corp., Atherton, CA (US);
Abstract
Aberrations on a surface, such as shots on a target, are identified through image processing techniques using color subtraction. An image of the surface is first initialized by shrinking the image and identifying pixel colors. A quantization algorithm is used to identify K number of colors, and acceptable variations for those colors are identified, and then stored in a color palette. Future images are analyzed by subtracting colors that match colors in the color palette. Remaining colors are aged in, and then compared with previously identified aberrations (shots). Image processing techniques then verify the potential aberrations. Data concerning verified aberrations are then displayed on remote user interfaces.