The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 20, 2026

Filed:

Mar. 30, 2020
Applicant:

Drexel University, Philadelphia, PA (US);

Inventors:

Owen Mayer, Philadelphia, PA (US);

Matthew C. Stamm, Philadelphia, PA (US);

Assignee:

Drexel University, Philadelphia, PA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/80 (2017.01);
U.S. Cl.
CPC ...
G06T 7/80 (2017.01); G06T 2207/10024 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract

Information about an image's source camera model is important knowledge in many forensic investigations. In this paper the system(s) pro-pose a system that compares two image patches to determine if they were captured by the same camera model. To do this, the system(s) first train a CNN based feature extractor to output generic, high level features which encode information about the source camera model of an image patch. Then, the system(s) learn a similarity measure that maps pairs of these features to a score indicating whether the two image patches were captured by the same or different camera models. The system(s) show that the proposed system accurately determines if two patches were captured by the same or different camera models, even when the camera models are unknown to the investigator. The system(s) also demonstrate the utility of this approach for image splicing detection and localization.


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