The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 20, 2026

Filed:

Dec. 21, 2022
Applicant:

Aidash, Inc., Palo Alto, CA (US);

Inventor:

Kanishk Varshney, Gurgaon, IN;

Assignee:

AIDash, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/32 (2017.01);
U.S. Cl.
CPC ...
G06T 7/32 (2017.01); G06T 2207/10032 (2013.01); G06T 2207/20021 (2013.01);
Abstract

Example systems, methods, and non-transitory computer readable media are directed to obtaining a first image and a second image, wherein the second image is an image to be evaluated with respect to the first image for alignment; generating tiles for the first image and the second image; measuring one or more respective alignment offsets between a plurality of tiles associated with the second image and corresponding tiles associated with the first image; classifying the plurality of tiles as aligned or misaligned based on the respective alignment offsets measured; determining that the classified plurality of tiles associated with the second image satisfy a tile threshold; and co-registering the second image with the first image based at least in part on the determination that the classified plurality of tiles associated with the second image satisfy the tile threshold.


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