The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 20, 2026

Filed:

Jul. 14, 2020
Applicant:

Telefonaktiebolaget Lm Ericsson (Publ), Stockholm, SE;

Inventors:

Mats Folkesson, Täby, SE;

Farnaz Moradi, Stockholm, SE;

Selim Ickin, Stocksund, SE;

Xiaoyu Lan, Täby, SE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/20 (2017.01); G06T 7/00 (2017.01); G06T 7/70 (2017.01); G06V 10/774 (2022.01); G06V 10/776 (2022.01); G06V 10/94 (2022.01); G06V 20/50 (2022.01);
U.S. Cl.
CPC ...
G06T 7/20 (2013.01); G06T 7/0002 (2013.01); G06T 7/70 (2017.01); G06V 10/774 (2022.01); G06V 10/776 (2022.01); G06V 10/945 (2022.01); G06V 20/50 (2022.01); G06T 2200/24 (2013.01); G06T 2207/20081 (2013.01);
Abstract

There is provided a method comprising: acquiring () sensor data related to an object; using the first learning module, identifying () the object based on the acquired sensor data using a first learning module and determining () a user associated with the identified object; determining () a timestamped location of the object based on at least one of the acquired sensor data and one or more locations of the one or more sensors; performing () a first analysis to determine whether the current status of the object contains an anomaly based on one or more predefined rules stored in a knowledge base; performing () a second analysis to determine whether the current status of the object contains an anomaly, using a second learning module; and validating () whether the current status of the object contains an anomaly based on results of the first analysis and results of the second analysis.


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