The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2026
Filed:
Mar. 06, 2023
Applicant:
Sysmex Corporation, Kobe, JP;
Inventor:
Hajimu Kawakami, Kobe, JP;
Assignee:
SYSMEX CORPORATION, Kobe, JP;
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/90 (2017.01); G01N 1/30 (2006.01); G01N 33/96 (2006.01); G01N 35/00 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G01N 1/30 (2013.01); G01N 33/96 (2013.01); G01N 35/00613 (2013.01); G06T 7/90 (2017.01); G01N 2496/05 (2013.01); G06T 2200/24 (2013.01); G06T 2207/20092 (2013.01); G06T 2207/30024 (2013.01); G06T 2207/30168 (2013.01);
Abstract
A method of generating smear quality control information according to an embodiment may include: obtaining a plurality of image data from a plurality of smears, respectively; obtaining, from the plurality of image data, feature values each of which reflects a staining state of each smear; and generating quality control information based on the feature values.
Kawakami, Hajimu. (2026). Method of generating quality control information, apparatus for generating quality control information, and program (U.S. Patent No. 12530769). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12530769
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