The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2026
Filed:
Jun. 24, 2021
Goertek Inc., Shandong, CN;
Zengyuan Gai, Shandong, CN;
Xiaoyu Chi, Shandong, CN;
GOERTEK INC., Shandong, CN;
Abstract
A defect detection method and apparatus and an electronic device are disclosed. The method comprises: acquiring an image of an object to be detected (S); acquiring brightness information of pixels in the image (S); and acquiring appearance defect information of the object to be detected based on the brightness information (S), wherein the appearance defect information represents defects existing in an appearance of the object to be detected. This method enables the electronic device to quickly and accurately obtain the appearance defect information of the object to be detected, thereby saving human labor and improving the user experience.