The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 20, 2026

Filed:

Sep. 25, 2020
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Jianquan Liu, Tokyo, JP;

Youhei Sasaki, Tokyo, JP;

Yuta Namiki, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06F 3/0482 (2013.01);
U.S. Cl.
CPC ...
G06T 7/00 (2013.01); G06F 3/0482 (2013.01);
Abstract

The present invention provides an image analysis system () including: a plurality of image analysis units (); a selection unit () that selects at least one of a plurality of the image analysis units (); an analysis control unit () that causes the selected image analysis unit () to analyze an image specified by a user; and an output unit () that outputs an analysis result of the image.


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