The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 20, 2026

Filed:

Jan. 15, 2024
Applicant:

Transportation Ip Holdings, Llc, Norwalk, CT (US);

Inventors:

Somnath Barole, Bangalore, IN;

Rithesh M, Bangalore, IN;

Vishram Nandedkar, Bangalore, IN;

Krishnamurthy Vaidyanathan, Bangalore, IN;

James D Brooks, Grove City, PA (US);

Guangliang Zhao, Niskayuna, NY (US);

Weina Ge, San Ramon, CA (US);

Peter Tu, Niskayuna, NY (US);

Derek K. Woo, Melbourne, FL (US);

Daniel J. Rush, Saint Charles, IL (US);

Adam Franco, Melbourne, FL (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06Q 10/04 (2023.01); B61L 25/02 (2006.01); B61L 25/04 (2006.01); G06F 18/21 (2023.01); G06N 3/04 (2023.01); G06N 3/08 (2023.01); G06Q 10/087 (2023.01); G06Q 50/40 (2024.01); G06T 7/20 (2017.01); G06V 20/00 (2022.01); G06V 20/62 (2022.01); G06V 30/10 (2022.01); G06V 30/14 (2022.01); G06V 30/19 (2022.01); G06V 30/224 (2022.01); G06V 40/20 (2022.01);
U.S. Cl.
CPC ...
G06Q 10/04 (2013.01); B61L 25/028 (2013.01); B61L 25/04 (2013.01); G06F 18/21 (2023.01); G06N 3/04 (2013.01); G06N 3/08 (2013.01); G06Q 10/087 (2013.01); G06Q 50/40 (2024.01); G06T 7/20 (2013.01); G06V 20/00 (2022.01); G06V 20/62 (2022.01); G06V 30/1429 (2022.01); G06V 30/1448 (2022.01); G06V 30/19173 (2022.01); G06V 30/2253 (2022.01); G06V 40/25 (2022.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06V 30/10 (2022.01); G06V 2201/07 (2022.01);
Abstract

A defect detection system includes one or more route optical sensors configured to generate image data depicting an underbody of a vehicle that is on a route. The defect detection system also includes a controller configured to input the image data generated by the one or more route optical sensors into a first machine learning algorithm that determines an area of interest in the image data. The area of interest contains equipment of interest. The controller is configured to input the image data that is within the area of interest into a second machine learning algorithm that detects a defect on the equipment of interest. The controller is configured to perform at least one responsive action based on a type of defect that is detected.


Find Patent Forward Citations

Barole, Somnath. (2026). System and method for vehicle defect detection (U.S. Patent No. 12530636). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12530636

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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