The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2026
Filed:
Jun. 28, 2019
Telefonaktiebolaget Lm Ericsson (Publ), Stockholm, SE;
TELEFONAKTIEBOLAGET LM ERICSSON (PUBL), Stockholm, SE;
Abstract
A method of method of classifying data is disclosed. The method comprises manipulating quantum states of qubits of a quantum computing device based on a first copy of a test vector, a second copy of the test vector, a first training vector and a second training vector, so as to load a modified first copy of the test vector, a modified second copy of the test vector, a modified first training vector and a modified second training vector onto the quantum computing device, wherein the magnitude of the angle between the modified first copy of the test vector and the modified first training vector is equal to the magnitude of the angle between the first copy of the test vector and the first training vector, and where the magnitude of the angle between the modified second copy of the test vector and the modified second training vector is equal to the magnitude of the angle between the second copy of the test vector and the second training vector. The method also comprises performing quantum interference between the modified first copy of the test vector and the modified second copy of the test vector, and the modified first training vector and the modified second training vector, to provide modified quantum states of the qubits, performing a measurement on one or more of the qubits, and classifying the test vector based on the measurement.