The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2026
Filed:
Aug. 24, 2021
Oracle International Corporation, Redwood Shores, CA (US);
Biju Narayanan, Trivandrum, IN;
Milind Gurudassa Xete Chatim Aldoncar, Baina, IN;
Hari Gopinathan Nair Indira Devi, Kumarapuram, IN;
Deepankar Narayanan, Thiruvananthapuram, IN;
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
A system uses a machine learning model to identify anomalies and modify parameters of a computing environment. The system modifies parameters of a computing environment based on the presence and absence of anomalies in the computing system while avoiding modifying parameters as a result of brief spikes in computing environment attributes. The system uses a machine learning model to generate predictions of anomalies for data points of computing environment attributes. The system compiles sets of predictions into batches. The system determines whether each batch includes enough anomalous-labeled data points to be considered an anomalous batch. The system compiles the batches into sets. The system determines whether the sets of batches include enough anomalous batches to be considered an anomalous set of batches. The system modifies the parameters of the computing environment based on determining whether or not the sets of batches are anomalous.