The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 20, 2026

Filed:

Sep. 29, 2023
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Ji Dai, Shanghai, CN;

Xin Zhang, Shanghai, CN;

Vadim Makhervaks, Bellevue, WA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/27 (2019.01); G06F 16/23 (2019.01);
U.S. Cl.
CPC ...
G06F 16/27 (2019.01); G06F 16/2379 (2019.01);
Abstract

The disclosed technology includes fault-tolerant data replication system implemented by a cluster of compute devices. The system includes a witness comprising persistent data storage and multiple nodes configured to selectively execute leader node operations when serving as a leader of the cluster. The leader node operations include detecting an availability status change for a follower node of the cluster and, in response, updating a subterm and a replication set. The subterm identifies a total number of availability status changes detected within the cluster over a given time interval, and the replication set identifies set of entities designated to provide acknowledgments counted when determining whether to commit a message following message replication. The leader node operations further include writing the replication set, the subterm, and other metadata to the witness in response to receiving a first client message from a client application following the availability status change.


Find Patent Forward Citations

Dai, Ji. (2026). Increasing fault tolerance in a multi-node replication system (U.S. Patent No. 12530370). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12530370

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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