The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 20, 2026

Filed:

Aug. 10, 2023
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Jie Ru Shi, Shanghai, CN;

Zhang Qin, Shanghai, CN;

Dong Xiaoxuan, Shanghai, CN;

Xiaowei Shen, Shanghai, CN;

Tian Yu Zheng, Shanghai, CN;

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/3668 (2025.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01); G06N 20/00 (2019.01);
Abstract

An information handling system stores a list of commands associated with test cases. The system receives the list of commands associated with the test cases, and provides the list of commands to an input layer of a state attributes probability machine learning model. An output layer of the of the state attributes probability machine learning model outputs a state attributes probability. The state attributes probability identifies an overlap of state attributes of test steps in the test cases. Based on the state attributes probability, the system determines whether the test steps of the test cases are in conflict. In response to the test steps not being in conflict, the system merges the test cases. In response to the test steps being in conflict, the system stops a merging of the test cases.


Find Patent Forward Citations

Shi, Jie. (2026). Component to determine test steps conflicts in a firmware test (U.S. Patent No. 12530279). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12530279

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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