The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 20, 2026

Filed:

Oct. 30, 2023
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Tariq Hanif, Lagrangeville, NY (US);

Tabor R. Powelson, Poughkeepsie, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0793 (2013.01); G06F 11/0745 (2013.01);
Abstract

Triggering a storage system swap event based on device error impact includes monitoring for input/output (I/O) errors on each of a plurality of storage devices of a first storage system. A criticality attribute of each of the plurality of storage devices is determined. A device score is calculated for each of the plurality of storage devices based on a number of I/O errors detected for the storage device. A swap score value for the first storage system is calculated based on the criticality attribute of each of the plurality of storage devices and the device score for each of the plurality of storage devices. Whether to either perform or bypass a storage swap event is determined based on the swap score value, wherein the storage swap event includes swapping between usage of the first storage system and a second storage system by a computing system.


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