The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2026
Filed:
Oct. 20, 2021
Ouster, Inc., San Francisco, CA (US);
Angus Pacala, San Francisco, CA (US);
Marvin Shu, San Francisco, CA (US);
Ouster, Inc., San Francisco, CA (US);
Abstract
An optical measurement system may include a light source and corresponding photosensor configured to emit and detect photons reflected from objects in a surrounding environment for optical measurements. An initial peak can be identified as resulting from reflections off a housing of the optical measurement system. This peak can be removed or used to calibrate measurement calculations of the system. Peaks resulting from reflections off surrounding objects can be processed using on-chip filters to identify potential peaks, and the unfiltered data can be passed to an off-chip processor for distance calculations and other measurements. A spatial filtering technique may be used to combine values from histograms for spatially adjacent pixels in a pixel array. This combination can be used to increase the confidence for distance measurements.