The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 20, 2026

Filed:

Mar. 08, 2024
Applicant:

Toyota Jidosha Kabushiki Kaisha, Toyota, JP;

Inventor:

Hayate Yamano, Susono, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/02 (2006.01); G01R 33/032 (2006.01);
U.S. Cl.
CPC ...
G01R 33/032 (2013.01);
Abstract

Provided is a method of estimating a magnetic field strength with a higher accuracy. The method of estimating a magnetic field strength includes detecting fluorescence emitted from diamond having nitrogen-vacancy centers with an external magnetic field applied thereto, by irradiating the diamond with excitation light and sweeping microwaves; removing, as noise, a long-periodic component having a value greater than a preset threshold from the detected fluorescence; fitting the fluorescence remaining after the removing of noise; and estimating a strength of the external magnetic field based on the fluorescence after the fitting.


Find Patent Forward Citations

Yamano, Hayate. (2026). Method of estimating magnetic field strength (U.S. Patent No. 12529735). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12529735

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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