The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2026
Filed:
Apr. 23, 2020
New York University, New York, NY (US);
Alexej Jerschow, New York, NY (US);
Mohaddese Mohammadi, Brooklyn, NY (US);
Emilia Silletta, Cordoba, AR;
Dmitry Budker, Mainz, DE;
Geoffrey Z. Iwata, Mainz, DE;
Yinan Hu, Mainz, DE;
Arne Wickenbrock, Mainz, DE;
John Blanchard, Mainz, DE;
NEW YORK UNIVERSITY, New York, NY (US);
Abstract
A method of diagnosing internal characteristics of a device includes applying a strong magnetic field to the device. The method can include reducing the strong magnetic field at a location of one or more sensors. At least one of the one or more sensors is proximate to the device. The method can include measuring induced magnetic fields around the device. The method can include measuring induced or intrinsic electrical current flow. The method can include measuring intrinsic magnetic properties. The induced magnetic fields can include diagnostic information on properties of the device and how the properties change over time. The device may be, for example, a battery, a capacitor, a supercapacitor, or a fuel cell. The presented measurement of magnetic susceptibility can be performed on materials, solutions, chemical substances, or tissue samples.