The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2026
Filed:
Apr. 02, 2021
Hitachi Zosen Corporation, Osaka, JP;
Takahiro Wada, Osaka, JP;
Ryota Ioka, Osaka, JP;
Kaoru Shinoda, Osaka, JP;
Takeru Katayama, Osaka, JP;
Kanadevia Corporation, Osaka, JP;
Abstract
Determination of presence or absence of a defect having irregular position, size, shape, and/or the like in an image are made automatically. An inspection device includes: an inspection image obtaining section that obtains an inspection image used to determine presence or absence of an internal defect in an inspection target; and a defect presence/absence determining section that determines presence or absence of a defect with use of a restored image generated by inputting the inspection image into a generative model constructed by machine learning that uses, as training data, an image of an inspection target in which a defect is absent, the generative model being constructed so as to generate a new image having a similar feature to that of an image input into the generative model.