The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 20, 2026

Filed:

Jan. 19, 2022
Applicant:

Scienta Omicron Ab, Uppsala, SE;

Inventors:

Mikael Olofsson, Uppsala, SE;

Patrik Karlsson, Uppsala, SE;

Assignee:

Scienta Omicron AB, Uppsala, SE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/2273 (2018.01); H01J 49/06 (2006.01);
U.S. Cl.
CPC ...
G01N 23/2273 (2013.01); H01J 49/06 (2013.01);
Abstract

Described is an angle-resolving photoelectron spectrometer comprising an electrostatic lens system having a first end and a second end, and arranged to form a beam of electrons emitted from a measurement area on a sample surface, and to transport the electrons to the second end, wherein the first lens element is configured to be arranged at a positive voltage in relation to the sample. The spectrometer comprises at least a first shielding electrode with a limiting aperture, arranged such that the angle between the optical axis and any point on the limiting aperture is larger than 45° and smaller than 70, and at least one compensation electrode which is arranged around the optical axis at a larger distance from the measurement area than the first lens element. The compensation electrode is configured to be arranged at a negative voltage in relation to the sample.


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