The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2026
Filed:
Mar. 17, 2021
The University of North Carolina AT Chapel Hill, Chapel Hill, NC (US);
Caterina M Gallippi, Cary, NC (US);
Christopher Joseph Moore, Durham, NC (US);
Joseph Brickey Richardson, Chapel Hill, NC (US);
THE UNIVERSITY OF NORTH CAROLINA AT CHAPEL HILL, Chapel Hill, NC (US);
Abstract
A method for quantitatively measuring a physical characteristic of a material includes applying a force to a material sample according to an interrogation profile comprising a set of one or more interrogation parameters. The method further includes measuring a displacement over time of the material sample that occurs as a result of applying the force according to the interrogation profile. The method further includes using the interrogation profile and the measured displacement over time of the material sample to derive a quantitative value of a physical characteristic of the material sample.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile