The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 20, 2026

Filed:

Jun. 17, 2021
Applicant:

Hewlett Packard Enterprise Development Lp, Houston, TX (US);

Inventors:

Tahir Cader, Liberty Lake, WA (US);

Sergey Serebryakov, Milpitas, CA (US);

Torsten Wilde, Berlin, DE;

Jeff Hanson, Houston, TX (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G01D 3/08 (2006.01); G01M 99/00 (2011.01);
U.S. Cl.
CPC ...
G01M 99/005 (2013.01); G01D 3/08 (2013.01); G06N 20/00 (2019.01);
Abstract

Systems and methods are provided for improving statistical and machine learning drift detection models that monitor computing health of a data center environment. For example, the system can receive streams of sensor data from a plurality of sensors in a data center; clean the streams of sensor data; generate, using a machine learning (ML) model, an anomaly score and a dynamic threshold value based on the cleaned streams of sensor data; determine, using the ML model and based on the anomaly score and the dynamic threshold value, a correctness indicator for a first sensor in the plurality of sensors; and using the correctness indicator, correct the first sensor.


Find Patent Forward Citations

Loading…