The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 20, 2026

Filed:

Jul. 16, 2020
Applicant:

Osram Opto Semiconductors Gmbh, Regensburg, DE;

Inventor:

Sergey Kudaev, Regensburg, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/02 (2006.01);
U.S. Cl.
CPC ...
G01J 3/0294 (2013.01); G01J 3/0208 (2013.01); G01J 3/0229 (2013.01); G01J 3/0259 (2013.01); G01J 3/0262 (2013.01);
Abstract

An optoelectronic measuring device may be used for the frequency-resolved measurement of an intensity of electromagnetic radiation. The device may include a plurality of measurement channels. A first of the measurement channels may have a first spectral sensitivity, and a further of the measurement channels may have a further spectral sensitivity different from the first spectral sensitivity. The device may further include a plurality of collimators for collimating the electromagnetic radiation. A separate optical path may extend through each of the collimators to one or more of the measurement channels. Each of the measurement channels may be arranged to measure an intensity of the electromagnetic radiation collimated by means of one or more of the collimators. The optoelectronic measuring device may have more collimators as compared to measurement channels.


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