The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2026
Filed:
Oct. 14, 2020
Kobelco Construction Machinery Co., Ltd., Hiroshima, JP;
Hiroshima University, Higashi-Hiroshima, JP;
Yukihiro Hoso, Hiroshima, JP;
Sho Fujiwara, Hiroshima, JP;
Yusuke Funahara, Hiroshima, JP;
Toru Tamaki, Hiroshima, JP;
KOBELCO CONSTRUCTION MACHINERY CO. , LTD., Hiroshima, JP;
HIROSHIMA UNIVERSITY, Higashi-Hiroshima, JP;
Abstract
A measurement device is configured to calculate, based on second measurement data provided by a distance detector, second contour data indicating a surface contour of an object contained in the container at a second time after a first time; calculate differential information indicating a difference between first posture data and second posture data which is posture data provided by a posture detector at the second time; rotate, based on the differential information, the second contour data in a three-dimensional coordinate space of the distance detector; and specify a region defined by the rotated second contour data and the first contour data, and calculate, based on the specified region, a volume of the object contained in the container at the second time.