The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 20, 2026

Filed:

Sep. 20, 2023
Applicant:

Toshiba Tec Kabushiki Kaisha, Tokyo, JP;

Inventors:

Yuki Takagi, Singapore, SG;

Akira Suzuki, Mishima Shizuoka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 11/00 (2006.01); B65H 7/02 (2006.01); B65H 26/02 (2006.01);
U.S. Cl.
CPC ...
B41J 11/006 (2013.01); B41J 11/0095 (2013.01); B41J 2202/31 (2013.01); B41J 2203/011 (2020.08);
Abstract

A thermal printerthat forms an image on sheet-shaped paper P using a print headand discharges the paper P through a discharge port, the printerincluding: an upper detection unitprovided closer to a side of the discharge port than to the print headin a conveyance path of the paper P, the upper detection unitbeing provided above the conveyance path and configured to detect an upward bias by the paper P; and a lower detection unitprovided closer to the side of the discharge port than to the print headin the conveyance path, the lower detection unitbeing provided below the conveyance path and configured to detect a downward bias by the paper P.


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Takagi, Yuki. (2026). Image forming apparatus and medium abnormality detection method (U.S. Patent No. 12528302). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12528302

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