The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 20, 2026

Filed:

Nov. 24, 2023
Applicant:

Freemelt Ab, Mölndal, SE;

Inventors:

Robin Stephansen, Mölndal, SE;

Ulf Ackelid, Gothenburg, SE;

Assignee:

FREEMELT AB, Mölndal, SE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B29C 64/393 (2017.01); B29C 64/153 (2017.01); B29C 64/268 (2017.01); B33Y 30/00 (2015.01); B33Y 50/00 (2015.01);
U.S. Cl.
CPC ...
B29C 64/393 (2017.08); B29C 64/153 (2017.08); B29C 64/268 (2017.08); B33Y 50/00 (2014.12); B33Y 30/00 (2014.12);
Abstract

In accordance with one or more embodiments herein, an arrangement for additive manufacturing by selective fusion, using an electron beam, of a three-dimensional product from a powder bed, is provided. The arrangement comprises at least one electron detecting arrangement arranged to detect powder smoke by detecting electrons which have been scattered by the electron beam hitting powder particles which levitate above the powder bed. Also provided is a method for detecting powder smoke during additive manufacturing, the method comprising: arranging at least one electron detecting arrangement in an arrangement for additive manufacturing by selective fusion, using an electron beam, of a three-dimensional product from a powder bed; detecting electrons which have been scattered by the electron beam hitting powder particles which levitate above the powder bed; and determining whether there is powder smoke based on the output from the at least one electron detecting arrangement.


Find Patent Forward Citations

Loading…