The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2026
Filed:
Jun. 18, 2024
Shantou Institute of Ultrasonic Instruments Co., Ltd., Shantou, CN;
Delai Li, Shantou, CN;
Liexiang Fan, Shantou, CN;
Yu Wang, Shantou, CN;
Bin Li, Shantou, CN;
Zhonghong Wu, Shantou, CN;
Haomiao Qiu, Shantou, CN;
Zhongyun Wei, Shantou, CN;
Zehang Cai, Shantou, CN;
Yuqiang Kang, Shantou, CN;
Peifeng Chen, Shantou, CN;
Shantou Institute of Ultrasonic Instruments Co., Ltd., Shantou, CN;
Abstract
Disclosed is a compound method of shear-wave elastography (SWE) and quasi-static elastography (QSE). The method includes: firstly, pre-scanning is carried out on a target region to obtain a rough comparison relation curve, then real-time scanning is carried out. The rough comparison relation curve is optimized and corrected to obtain an accurate comparison relation curve. Finally, the real-time shear modulus of a large area is calculated according to the real-time elastic relative value of the large area, so that accurate real-time elastography is realized.